Characterization of ferroelectricity in metal/ferroelectric/insulator/semiconductor structure by pulsed C–V measurement; Ferroelectricity in YMnO[sub 3]/Y[sub 2]O[sub 3]/Si structure
Yoshimura, Takeshi, Fujimura, Norifumi, Ito, Daisuke, Ito, TaichiroVolume:
87
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.372364
File:
PDF, 399 KB
english, 2000