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[IEEE 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Portland, OR, USA (2012.09.30-2012.10.3)] 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Impact of the emitter stored charge on RF noise of junction bipolar transistors
Vitale, Francesco, van der Toorn, RamsesYear:
2012
Language:
english
DOI:
10.1109/bctm.2012.6352625
File:
PDF, 264 KB
english, 2012