[IEEE Second Annual Symposium on the Physics of Failure in...

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[IEEE Second Annual Symposium on the Physics of Failure in Electronics - Chicago, IL, USA (1963.09.25-1963.09.26)] Second Annual Symposium on the Physics of Failure in Electronics - Comprehensive Failure Mechanism Theory-Metal Film Resistor Behavior

Goldberg, M., Horberg, A., Stewart, R., Levinson, D.
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Year:
1963
Language:
english
DOI:
10.1109/irps.1963.362238
File:
PDF, 14.32 MB
english, 1963
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