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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Modeling the gain due to maintenance over transformer lifespan
Guessoum, Yacine, Grall, Antoine, Barros, Anne, Aupied, JeanYear:
2011
Language:
english
DOI:
10.1109/rams.2011.5754511
File:
PDF, 459 KB
english, 2011