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[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - Through silicon via admittance field solver of system level capacity: Theory
Kourkoulos, Vassilis, Suaya, RobertoYear:
2013
Language:
english
DOI:
10.1109/sapiw.2013.6558313
File:
PDF, 697 KB
english, 2013