![](/img/cover-not-exists.png)
Influence of oxygen stoichiometry analyzed by XPS and XAES in high textured YBa2Cu3O7−x thin films
H. Guyot, L. Schmidt, R. Cinti, P.L. Reydet, J. MarcusVolume:
162-164
Year:
1989
Language:
english
Pages:
2
DOI:
10.1016/0921-4534(89)90705-3
File:
PDF, 150 KB
english, 1989