Electrical characterization of grain boundaries in GaAs

Electrical characterization of grain boundaries in GaAs

Spencer, Michael G., Schaff, William J., Wagner, D. Ken
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Volume:
54
Year:
1983
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.332168
File:
PDF, 1.09 MB
english, 1983
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