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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Study of electric field—based lifetime projection method in IMD TDDB
Zhang, W., Zeng, X., Liu, W., Lim, Y. K., Liu, J. F., Chua, E. C.Year:
2010
Language:
english
DOI:
10.1109/irps.2010.5488703
File:
PDF, 527 KB
english, 2010