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[IEEE 2010 IEEE 26th International Conference on Data Engineering Workshops (ICDEW 2010) - Long Beach, CA, USA (2010.03.1-2010.03.6)] 2010 IEEE 26th International Conference on Data Engineering Workshops (ICDEW 2010) - Duplicate detection in probabilistic data
Panse, Fabian, van Keulen, Maurice, de Keijzer, Ander, Ritter, NorbertYear:
2010
Language:
english
DOI:
10.1109/icdew.2010.5452759
File:
PDF, 188 KB
english, 2010