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[IEEE 2009 IEEE International Workshop on Imaging Systems and Techniques (IST) - Shenzhen, China (2009.05.11-2009.05.12)] 2009 IEEE International Workshop on Imaging Systems and Techniques - Residual safety problem of thermal-imaging based luminaire testing system
Chen, Lingfeng, Li, Xinkang, Su, JianmingYear:
2009
Language:
english
DOI:
10.1109/ist.2009.5071677
File:
PDF, 924 KB
english, 2009