[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Measurement and visualization of the radiation patterns of portable electronic devices design of a near field scanner and first measurements
Doring, Oliver, Rohrsen, Bjorn, Battermann, Sven, Garbe, Heyno, Stadtler, Thiemo, Kebel, RobertYear:
2008
Language:
english
DOI:
10.1109/emceurope.2008.4786903
File:
PDF, 229 KB
english, 2008