Direct measurement of majority-carrier quasi-Fermi levels...

Direct measurement of majority-carrier quasi-Fermi levels in Schottky barrier and metal-insulator-semiconductor diodes

Seager, C. H., Schubert, W. K.
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Volume:
62
Year:
1987
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.339061
File:
PDF, 600 KB
english, 1987
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