[IEEE 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2012.09.19-2012.09.21)] 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - An improved P+/N diode leakage current in BiCMOS technologies with fluorine co-implant
Saad, Siti Zubaidah Md, Lik, Tan Chan, Othman, Marhanis Abu, Holger, Poehle, Herman, Sukreen HanaYear:
2012
Language:
english
DOI:
10.1109/smelec.2012.6417237
File:
PDF, 1.14 MB
english, 2012