[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - At-speed BIST for interposer wires supporting on-the-spot diagnosis
Shi-Yu Huang,, Jeo-Yen Lee,, Kun-Han Tsai,, Wu-Tung Cheng,Year:
2013
DOI:
10.1109/iolts.2013.6604053
File:
PDF, 294 KB
2013