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[IEEE 2010 XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD) - Gammarth, Tunisia (2010.10.4-2010.10.6)] 2010 XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD) - Variability aware yield optimal sizing of analog circuits using SVM-genetic approach
Boolchandani, D., Garg, Lokesh, Khandelwal, Sapna, Sahula, VineetYear:
2010
Language:
english
DOI:
10.1109/sm2acd.2010.5672332
File:
PDF, 824 KB
english, 2010