![](/img/cover-not-exists.png)
Confidence intervals for the kappa parameter, with application to the semiconductor industry
Wilkinson, Rachelle C., Bruce Schaalje, G., Collings, Bruce JayVolume:
29
Language:
english
Journal:
Communications in Statistics - Simulation and Computation
DOI:
10.1080/03610910008813633
Date:
January, 2000
File:
PDF, 567 KB
english, 2000