Confidence intervals for the kappa parameter, with...

Confidence intervals for the kappa parameter, with application to the semiconductor industry

Wilkinson, Rachelle C., Bruce Schaalje, G., Collings, Bruce Jay
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Volume:
29
Language:
english
Journal:
Communications in Statistics - Simulation and Computation
DOI:
10.1080/03610910008813633
Date:
January, 2000
File:
PDF, 567 KB
english, 2000
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