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dc-bias stress of non-stochiometric amorphous silicon nitride thin film diodes
Nieuwesteeg, K. J. B. M., van der Put, A. A., Johnson, M. T., de Kort, C. G. C.Volume:
79
Year:
1996
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.360830
File:
PDF, 414 KB
english, 1996