Surface potential determination in irradiated MOS transistors combining current-voltage and charge pumping measurements
Masson, P., Autran, J.L., Raynaud, C., Flament, O., Paillet, P., Chabrerie, C.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685207
Date:
June, 1998
File:
PDF, 970 KB
english, 1998