Transport anisotropy in microcrystalline silicon studied by...

Journal of Applied Physics 2001 Vol. 89; Iss. 3

Transport anisotropy in microcrystalline silicon studied by measurement of ambipolar diffusion length

Švrček, V., Pelant, I., Kočka, J., Fojtı́k, P., Rezek, B., Stuchlı́ková, H., Fejfar, A., Stuchlı́k, J., Poruba, A., Toušek, J.
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Volume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1338996
File:
PDF, 733 KB
english, 2001
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