Positron annihilation spectroscopy applied to porous...

Journal of Applied Physics 1995 Vol. 78; Iss. 7

Positron annihilation spectroscopy applied to porous silicon films

Knights, A. P., Kowalski, G., Saleh, A. S., Towner, A., Patel, M. I., Rice-Evans, P. C., Moore, M., Gledhill, G. A., Nossarzewska-Orlowska, E., Brzozowski, A.
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Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.359848
File:
PDF, 890 KB
english, 1995
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