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[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - A voltage driver using the rail to rail operation in CMOS 0, 25 μm technology
Meddour, Faycal, Dibi, Zohir, Kouda, Souhil, Abdi, Mohamed Amir, Manck, OttoYear:
2008
Language:
english
DOI:
10.1109/idt.2008.4802479
File:
PDF, 3.09 MB
english, 2008