Electroreflectance bias-wavelength mapping of the...

Electroreflectance bias-wavelength mapping of the modulation Si δ-doped pseudomorphic GaAs/InGaAs/AlGaAs structure

Tomaszewicz, T., Babiński, A., Suska, D., Baranowski, J. M., Tomaszewicz, A.
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Volume:
75
Year:
1999
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.124925
File:
PDF, 476 KB
english, 1999
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