Formation and deterioration mechanisms of low-resistance...

Journal of Applied Physics 1999 Vol. 86; Iss. 9

Formation and deterioration mechanisms of low-resistance TaTi ohmic contacts for p-GaN

Suzuki, Masaaki, Arai, T., Kawakami, T., Kobayashi, S., Fujita, S., Koide, Yasuo, Taga, Y., Murakami, Masanori
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
86
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371483
File:
PDF, 428 KB
english, 1999
Conversion to is in progress
Conversion to is failed