Generation and annihilation of traps in...

Generation and annihilation of traps in metal-oxide-semiconductor devices after negative air corona charging

Prasad, Ila, Srivastava, R. S.
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Volume:
74
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.354117
File:
PDF, 800 KB
english, 1993
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