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Oxide and interface degradation resulting from substrate hot-hole injection in metal-oxide-semiconductor field-effect transistors at 295 and 77 K
Van den bosch, Geert, Groeseneken, Guido, Maes, Herman E., Klein, Richard B., Saks, Nelson S.Volume:
75
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.356311
File:
PDF, 1.21 MB
english, 1994