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[IEEE 40th Conference on Electronic Components and Technology - Las Vegas, NV, USA (20-23 May 1990)] 40th Conference Proceedings on Electronic Components and Technology - Damage storage measurement in Pb-Sn solder
Tien, J.K., Hendrix, B.C., Attarwala, A.I.Year:
1990
Language:
english
DOI:
10.1109/ectc.1990.122231
File:
PDF, 457 KB
english, 1990