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[IEEE 2013 IEEE International Wireless Symposium (IWS) - Beijing, China (2013.04.14-2013.04.18)] 2013 IEEE International Wireless Symposium (IWS) - Generation-recombination traps in AlGaN/GaN HEMT analyzed by time-domain and frequency-domain measurements: Impact of HTRB stress on short term and long term memory effects
Tartarin, J. G., Astre, G., Karboyan, S., Noutsa, T., Lambert, B.Year:
2013
Language:
english
DOI:
10.1109/ieee-iws.2013.6616840
File:
PDF, 771 KB
english, 2013