Measurements of a component of the piezo-optic tensor of Si by reflectance difference spectroscopy
Mori, Takahiro, Kumagai, Naoto, Hanada, Takashi, Yao, Takafumi, Yasuda, TetsujiVolume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1586965
File:
PDF, 318 KB
english, 2003