Measurements of a component of the piezo-optic tensor of Si...

Measurements of a component of the piezo-optic tensor of Si by reflectance difference spectroscopy

Mori, Takahiro, Kumagai, Naoto, Hanada, Takashi, Yao, Takafumi, Yasuda, Tetsuji
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Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1586965
File:
PDF, 318 KB
english, 2003
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