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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding
Wang, Seongmoon, Wei, Wenlong, Chakradhar, Srimat T.Year:
2007
Language:
english
DOI:
10.1109/ats.2007.52
File:
PDF, 323 KB
english, 2007