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[IEEE IWSM. 1998 3rd International Workshop on Statistical Metrology - Honolulu, HI, USA (7 June 1998)] IWSM. 1998 3rd International Workshop on Statistical Metrology (Cat. No.98EX113) - Approaches to statistical circuit analysis for deep sub-micron technologies
Orshansky, M., Chen, J.C., Hu, C., Wan, D., Bendix, D.Year:
1998
Language:
english
DOI:
10.1109/iwstm.1998.729753
File:
PDF, 301 KB
english, 1998