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[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Analysis of carbon-based interconnect breakdown
Kitsuki, Hirohiko, Tsutomu Saito,, Yamada, Toshishige, Fabris, Drazen, Wilhite, Patrick, Suzuki, Makoto, Yang, Cary Y.Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734591
File:
PDF, 2.40 MB
english, 2008