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Comparison Measurements of Silicon Carbide Temperature Monitors
Rempe, Joy L., Condie, Keith G., Knudson, Darrell L., Snead, Lance L.Volume:
57
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2010.2046333
Date:
June, 2010
File:
PDF, 482 KB
english, 2010