[IEEE IECON '93 - 19th Annual Conference of IEEE Industrial Electronics - Maui, HI, USA (15-19 Nov. 1993)] Proceedings of IECON '93 - 19th Annual Conference of IEEE Industrial Electronics - Tampoprint inspection by artificial vision
Truchetet, F., Cholley, J.P., Hemmings, S.Year:
1993
Language:
english
DOI:
10.1109/iecon.1993.339361
File:
PDF, 460 KB
english, 1993