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Current-Induced Magnetization Switching Probability in MgO-Based Magnetic Tunnel Junctions
Lee, J. M., Ye, L. X., Weng, M. C., Chen, Y. C., Su, J. P., Wu, Te-HoVolume:
43
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2006.888507
Date:
February, 2007
File:
PDF, 266 KB
english, 2007