[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Accessing Embedded DfT Instruments with IEEE P1687
Larsson, Erik, Zadegan, Farrokh GhaniYear:
2012
Language:
english
DOI:
10.1109/ats.2012.74
File:
PDF, 364 KB
english, 2012