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[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Statistics for matching
Pergoot, A., Graindourze, B., Janssens, E., Bastos, J., Steyaert, M., Kinget, P., Roovers, R., Sansen, W.Year:
1995
Language:
english
DOI:
10.1109/icmts.1995.513971
File:
PDF, 299 KB
english, 1995