[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Fully electronic DNA detection on a CMOS chip: device and process issues
Hofmann, F., Frey, A., Holzapfl, B., Schienle, M., Paulus, C., Schindler-Bauer, P., Kuhlmeier, D., Krause, J., Hintsche, R., Nebling, E., Albers, J., Gumbrecht, W., Plehnert, K., Eckstein, G., Thewes,Year:
2002
Language:
english
DOI:
10.1109/iedm.2002.1175886
File:
PDF, 384 KB
english, 2002