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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Multiple-output propagation transition fault test
Chao-Wen Tseng,, McCluskey, E.J.Year:
2001
Language:
english
DOI:
10.1109/test.2001.966652
File:
PDF, 782 KB
english, 2001