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[JEDEC 2002 GaAs Reliability Workshop. - Monterey, CA, USA (20 Oct. 2002)] GaAs Reliability 2002 Workshop - Hot electron effects on undoped AlGaN/GaN high electron mobility transistors
Kim, H., Vertiatchikh, A., Tilak, V., Thompson, R.M., Prunty, T., Shealy, J.R., Eastman, L.F.Year:
2002
Language:
english
DOI:
10.1109/gaas.2002.1167856
File:
PDF, 101 KB
english, 2002