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[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Low energy data management for different on-chip memory levels in multi-context reconfigurable architectures
Sanchez-Elez, M., Fernandez, M., Anido, M., Du, H., Bagherzadeh, N., Hermida, R.Year:
2003
Language:
english
DOI:
10.1109/date.2003.1253584
File:
PDF, 273 KB
english, 2003