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[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - TRAM: A tool for Temperature and Reliability Aware Memory Design
Khajeh, A., Gupta, A., Dutt, N., Kurdahi, F., Eltawil, A., Khouri, K., Abadir, M.Year:
2009
Language:
english
DOI:
10.1109/date.2009.5090685
File:
PDF, 267 KB
english, 2009