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Atomic level scanning transmission electron microscopy characterization of GaN/AlN quantum wells
Mkhoyan, K. A., Kirkland, E. J., Silcox, J., Alldredge, E. S.Volume:
96
Year:
2004
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1756222
File:
PDF, 1.12 MB
english, 2004