Critical fields of W/Si multilayers
E. Rosseel, M. Baert, K. Temst, C. Potter, V.V. Moshchalkov, Y. Bruynseraede, P. Lobotka, I. Vavra, R. Senderak, M. JergelVolume:
225
Year:
1994
Language:
english
Pages:
7
DOI:
10.1016/0921-4534(94)90722-6
File:
PDF, 493 KB
english, 1994