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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - ISI Injection Filter Designs Using PIN and Varactor Diodes for SerDes Testing on ATE
Zhang, Fengming, Necoechea, WarrenYear:
2006
Language:
english
DOI:
10.1109/test.2006.297670
File:
PDF, 538 KB
english, 2006