Scaling behavior of U(I)-characteristics and zero-field...

Scaling behavior of U(I)-characteristics and zero-field resistive transitions in epitaxial Bi2Sr2CaCu2O8+δ thin films

P. Wagner, F. Hillmer, U. Frey, A. Hadish, Th. Kluge, K. Petersen, H. Adrian
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
235-240
Year:
1994
Language:
english
Pages:
2
DOI:
10.1016/0921-4534(94)91109-6
File:
PDF, 158 KB
english, 1994
Conversion to is in progress
Conversion to is failed