![](/img/cover-not-exists.png)
Scaling behavior of U(I)-characteristics and zero-field resistive transitions in epitaxial Bi2Sr2CaCu2O8+δ thin films
P. Wagner, F. Hillmer, U. Frey, A. Hadish, Th. Kluge, K. Petersen, H. AdrianVolume:
235-240
Year:
1994
Language:
english
Pages:
2
DOI:
10.1016/0921-4534(94)91109-6
File:
PDF, 158 KB
english, 1994