Nondestructive testing of cracks in solid aluminum with a high temperature rf-SQUID
D.F. Lu, Chang-xin Fan, Naser S. Alzayed, K.W. Wong, S.G. Han, J.Z. Ruan, Y. Xin, Bingruo Xu, Marvin Chester, David E. KnappVolume:
235-240
Year:
1994
Language:
english
Pages:
2
DOI:
10.1016/0921-4534(94)91207-6
File:
PDF, 168 KB
english, 1994