![](/img/cover-not-exists.png)
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - DC-Coupled Laser Induced Detection System for Fault Localization in Microelectronic Failure Analysis
Quah, Act, Koh, Ls, Chua, Cm, Palaniappan, M, Chin, Jm, Phang, JchYear:
2006
Language:
english
DOI:
10.1109/ipfa.2006.250981
File:
PDF, 3.93 MB
english, 2006