Charge trapping/generation and reliability for...

Journal of Applied Physics 1989 Vol. 66; Iss. 10

Charge trapping/generation and reliability for high-performance tantalum oxide capacitors

Byeon, S. G., Tzeng, Y.
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Volume:
66
Year:
1989
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.343799
File:
PDF, 930 KB
english, 1989
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