Interface structure of a-Si:H/ZnS multilayer films...

Journal of Applied Physics 1989 Vol. 65; Iss. 12

Interface structure of a-Si:H/ZnS multilayer films elucidated from electron-spin resonance and infrared-absorption measurements

Morimoto, Akiharu, Mizushima, Kazuyoshi, Shimizu, Tatsuo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
65
Year:
1989
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.343226
File:
PDF, 1.12 MB
english, 1989
Conversion to is in progress
Conversion to is failed