Phase formation and strain relaxation during thermal reaction of Zr and Ti with strained Si[sub 1−x−y]Ge[sub x]C[sub y] epilayers
Aubry-Fortuna, V., Tremblay, G., Meyer, F., Miron, Y., Roichman, Y., Eizenberg, M., Fortuna, F., Hörmann, U., Strunk, H.Volume:
88
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.373833
File:
PDF, 542 KB
english, 2000